| 国家/地区 |
Usa(4)
|
| 关键词 |
CONTACT RESISTANCE(4)
|
| 出版物 | IEEE ELECTRON DEVIC.(2) |
| 出版时间 |
2011(4)
|
| 机构 | |
| 作者 |
SOLID STATE COMMUNICATIONS
MALEC CE, ELKUS B, DAVIDOVIC D
APPLIED PHYSICS LETTERS
PARRISH KN, AKINWANDE D
IEEE ELECTRON DEVICE LETTERS
FRANKLIN AD, HAN SJ, BOL AA, HAENSCH W
IEEE ELECTRON DEVICE LETTERS
HSU A, WANG H, KIM KK, KONG J, PALACIOS T
