PHYSICAL REVIEW B
LIN IT, LIU JM, SHI KY, TSENG PS, WU KH, LUO CW, LI LJ
ADVANCED MATERIALS
WEISS NO, ZHOU HL, LIAO L, LIU Y, JIANG S, HUANG Y, DUAN XF
ACS NANO
KIM SM, SONG EB, LEE S, ZHU JF, SEO DH, MECKLENBURG M, SEO S, WANG KL
ACS NANO
LIU LX, ZHOU HL, CHENG R, YU WJ, LIU Y, CHEN Y, SHAW J, ZHONG X, HUANG Y, DUAN XF
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY
LI YJ, LI YJ, ZHU EB, MCLOUTH T, CHIU CY, HUANG XQ, HUANG Y
MICROELECTRONICS RELIABILITY
WANG YJ, HUANG BC, ZHANG M, WOO JCS
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA
CHENG R, BAI JW, LIAO L, ZHOU HL, CHEN Y, LIU LX, LIN YC, JIANG S, HUANG Y, DUAN XF
MATERIALS TODAY
LIAO L, DUAN XF
ACS NANO
WANG P, ZHANG W, LIANG O, PANTOJA M, KATZER J, SCHROEDER T, XIE YH
NANO LETTERS
LIAO L, BAI JW, CHENG R, ZHOU HL, LIU LX, LIU Y, HUANG Y, DUAN XF