国家/地区 | Usa(3) |
关键词 |
DEFECT(2)
GRAPHENE(2)
SCANNING TUNNELING .(2)
|
出版物 | |
出版时间 | 2013(2) |
机构 | OAK RIDGE NATL LAB(3) |
作者 | FEENSTRA RM(3) |
PHYSICAL REVIEW X
CLARK KW, ZHANG XG, GU G, PARK J, HE GW, FEENSTRA RM, LI AP
ACS NANO
CLARK KW, ZHANG XG, VLASSIOUK IV, HE GW, FEENSTRA RM, LI AP
NANO LETTERS
PARK J, HE GW, FEENSTRA RM, LI AP