国家/地区 Usa（2）
关键词 ATOMIC FORCE MICROSCOPY（2）
出版物 JOURNAL OF ELECTRONIC MATERIALS（2）
出版时间
机构
作者

Secondary Electron Intensity Contrast Imaging and Friction Properties of Micromechanically Cleaved Graphene Layers on Insulating Substrates

JOURNAL OF ELECTRONIC MATERIALS

GUPTA S, HEINTZMAN E, JASINSKI J

Empirical Study of Hall Bars on Few-Layer Graphene on C-Face 4H-SiC

JOURNAL OF ELECTRONIC MATERIALS

BOLEN ML, SHEN T, GU JJ, COLBY R, STACH EA, YE PD, CAPANO MA