国家/地区 Usa（4）
关键词
出版物 PHYSICAL REVIEW LET.（2）
出版时间 2010（4）
机构 COLUMBIA UNIV（4）
作者 MAK KF（4）

Measurement of the thermal conductance of the graphene/SiO2 interface

APPLIED PHYSICS LETTERS

MAK KF, LUI CH, HEINZ TF

Ultrafast Photoluminescence from Graphene

PHYSICAL REVIEW LETTERS

LUI CH, MAK KF, SHAN J, HEINZ TF

The evolution of electronic structure in few-layer graphene revealed by optical spectroscopy

PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA

MAK KF, SFEIR MY, MISEWICH JA, HEINZ TF

Electronic Structure of Few-Layer Graphene: Experimental Demonstration of Strong Dependence on Stacking Sequence

PHYSICAL REVIEW LETTERS

MAK KF, SHAN J, HEINZ TF