国家/地区 | Usa(3) |
关键词 |
DEFECT(2)
GRAPHENE(2)
SCANNING TUNNELING .(2)
|
出版物 | |
出版时间 | 2013(3) |
机构 | OAK RIDGE NATL LAB(3) |
作者 | LI AP(3) |
ACS NANO
CLARK KW, ZHANG XG, VLASSIOUK IV, HE GW, FEENSTRA RM, LI AP
NANO LETTERS
PARK J, HE GW, FEENSTRA RM, LI AP
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY
XIAO K, DENG W, KEUM JK, YOON M, VLASSIOUK IV, CLARK KW, LI AP, KRAVCHENKO II, GU G, PAYZANT EA, SUMPTER BG, SMITH SC, BROWNING JF, GEOHEGAN DB