国家/地区 | Italy(2) |
关键词 |
CONDUCTIVE ATOMIC FORCE MICROSCOPY(2)![]() |
出版物 | |
出版时间 |
2019(2)![]() |
机构 | |
作者 |
SCHILIRO E(2)![]() |
ACS APPLIED ELECTRONIC MATERIALS
GIANNAZZO F, GRECO G, SCHILIRO E, LO NIGRO R, DERETZIS I, LA MAGNA A, ROCCAFORTE F, IUCOLANO F, RAVESI S, FRAYSSINET E, MICHON A, CORDIER Y
NANOTECHNOLOGY
GIANNAZZO F, SHTEPLIUK I, IVANOV G, IAKIMOV T, KAKANAKOVAGEORGIEVA A, SCHILIRO E, FIORENZA P, YAKIMOVA R