SURFACE TOPOGRAPHYMETROLOGY PROPERTIES

GE TH, ZHAO WJ, HE YL, WU XD, WU YH, WU YM, CI XJ

PHYSICA STATUS SOLIDI AAPPLICATIONS MATERIALS SCIENCE

BROWN DB, BOUGHER TL, ZHANG X, AJAYAN PM, COLA BA, KUMAR S

ACS APPLIED MATERIALS INTERFACES

ZHU KC, LIANG XH, YUAN B, VILLENA MA, WEN C, WANG T, CHEN SC, HUI F, SHI YY, LANZA M

JOURNAL OF THE KOREAN PHYSICAL SOCIETY

PARK Y, HYUN S

NANO LETTERS

ONODERA M, WATANABE K, ISAYAMA M, ARAI M, MASUBUCHI S, MORIYA R, TANIGUCHI T, MACHIDA T

IEEE SENSORS JOURNAL

HASAN N, HOU B, RADADIA AD

JOURNAL OF PHOTONICS FOR ENERGY

WU XH, FU CJ, ZHANG ZM

NANOMATERIALS

LIANG WJ, GE X, GE JF, LI TH, ZHAO TK, CHEN XJ, ZHANG MC, JI JY, PANG XY, LIU RL

SMALL

HUNDI P, SHAHSAVARI R

ADVANCED MATERIALS

FAN MM, WU JJ, YUAN JT, DENG LZ, ZHONG N, HE L, CUI JW, WANG ZX, BEHERA SK, ZHANG CH, LAI JW, JAWDAT BI, VAJTAI R, DEB P, HUANG Y, QIAN JS, YANG JZ, TOUR JM, LOU J, CHU CW, SUN DP, AJAYAN PM