RSC ADVANCES

BAGLEY JD, KUMAR DK, SEE KA, YEH NC

NANOTECHNOLOGY

TSENG WS, CHEN YC, HSU CC, LU CH, WU CI, YEH NC

NATURE

ARORA HS, POLSKI R, ZHANG YR, THOMSON A, CHOI Y, KIM H, LIN Z, WILSON IZ, XU XD, CHU JH, WATANABE K, TANIGUCHI T, ALICEA J, NADJPERGE S

SCIENCE ADVANCES

HSU CC, TEAGUE ML, WANG JQ, YEH NC

MATTER

TORRENTERODRIGUEZ RM, TU JB, YANG YR, MIN JH, WANG MQ, SONG Y, YU Y, XU CH, YE C, ISHAK WW, GAO W

ACS APPLIED MATERIALS INTERFACES

THOMPSON AC, SIMPSON BH, LEWIS NS

CARBON

CHEN YC, LIN WH, TSENG WS, CHEN CC, ROSSMAN GR, CHEN CD, WU YS, YEH NC

NATURE PHYSICS

CHOI Y, KEMMER J, PENG Y, THOMSON A, ARORA H, POLSKI R, ZHANG YR, REN HC, ALICEA J, REFAEL G, VON OPPEN F, WATANABE K, TANIGUCHI T, NADJPERGE S

NANO LETTERS

THOMAS NH, SHERROTT MC, BROULLIET J, ATWATER HA, MINNICH AJ

IEEE SENSORS JOURNAL

JARAMILLOBOTERO A, MARMOLEJOTEJADA JM