国家/地区 Korea（3）
关键词
出版物 APPLIED PHYSICS LET.（2）
出版时间 2014（3）
机构 GWANGJU INST SCI TECHNOL（3）
作者 JUNG U（3）

Quantitatively estimating defects in graphene devices using discharge current analysis method

SCIENTIFIC REPORTS

JUNG U, LEE YG, KANG CG, LEE S, KIM JJ, HWANG HJ, LIM SK, HAM MH, LEE BH

Highly sensitive wide bandwidth photodetectors using chemical vapor deposited graphene

APPLIED PHYSICS LETTERS

KANG CG, LEE SK, YOO TJ, PARK W, JUNG U, AHN J, LEE BH

Quantitative analysis of interfacial reactions at a graphene/SiO2 interface using the discharge current analysis method

APPLIED PHYSICS LETTERS

JUNG U, LEE YG, KANG CG, LEE S, LEE BH