国家/地区 China（2）
关键词 SCANNING ELECTRON MICROSCOPY（2）
出版物
出版时间
机构 HARBIN INST TECHNOL（2）
作者 ZHANG D（2）

Graphene to graphene, and substrate to substrate: how to reliably differentiate supported graphene from polycrystalline substrates using SEM?

MATERIALS RESEARCH EXPRESS

HUANG L, ZHANG D, ZHANG FH, HUANG YD, GAN Y

High-Contrast SEM Imaging of Supported Few-Layer Graphene for Differentiating Distinct Layers and Resolving Fine Features: There is Plenty of Room at the Bottom

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HUANG L, ZHANG D, ZHANG FH, FENG ZH, HUANG YD, GAN Y