国家/地区 | Usa(2) |
关键词 | |
出版物 | ADVANCED MATERIALS .(2) |
出版时间 | 2017(4) |
机构 | RICE UNIV(4) |
作者 | TIWARY CS(4) |
PARTICLE PARTICLE SYSTEMS CHARACTERIZATION
RADHAKRISHNAN S, SUDEEP PM, PARK JH, WOELLNER CF, MALADONADO K, GALVAO DS, KAIPPARETTU BA, TIWARY CS, AJAYAN PM
NANOSCALE
PARK OK, TIWARY CS, YANG Y, BHOWMICK S, VINOD S, ZHANG QB, COLVIN VL, ASIF SAS, VAJTAI R, PENEV ES, YAKOBSON BI, AJAYAN PM
ADVANCED MATERIALS INTERFACES
OWUOR PS, WOELLNER CF, LI T, VINOD S, OZDEN S, KOSOLWATTANA S, BHOWMICK S, DUY LX, SALVATIERRA RV, WEI BQ, ASIF SAS, TOUR JM, VAJTAI R, LOU J, GALVAO DS, TIWARY CS, AJAYAN PM
ADVANCED MATERIALS INTERFACES
WU JJ, MA LL, SAMANTA A, LIU MJ, LI B, YANG YC, YUAN JT, ZHANG J, GONG YJ, LOU J, VAJTAI R, YAKOBSON B, SINGH AK, TIWARY CS, AJAYAN PM