国家/地区
关键词
出版物 NANOTECHNOLOGY（2）
出版时间
机构 TECH UNIV DENMARK（2）
作者 PETERSEN DH（2）

Wafer-scale graphene quality assessment using micro four-point probe mapping

NANOTECHNOLOGY

MACKENZIE DMA, KALHAUGE KG, WHELAN PR, OSTERGAARD FW, PASTERNAK I, STRUPINSKI W, BOGGILD P, JEPSEN PU, PETERSEN DH

Fast and direct measurements of the electrical properties of graphene using micro four-point probes

NANOTECHNOLOGY

KLARSKOV MB, DAM HF, PETERSEN DH, HANSEN TM, LOWENBORG A, BOOTH TJ, SCHMIDT MS, LIN R, NIELSEN PF, BOGGILD P