国家/地区 | China(2) Usa(2) |
关键词 | SCANNING TUNNELING MICROSCOPY(5) |
出版物 | 2D MATERIALS(5) |
出版时间 | 2019(5) |
机构 | BEIJING NORM.(2) |
作者 | CHEN MX(2) HE L(2) LI SY(2) |
2D MATERIALS
YAN C, MA DL, QIAO JB, ZHONG HY, YANG L, LI SY, FU ZQ, ZHANG Y, HE L
2D MATERIALS
LI SY, REN YN, LIU YW, CHEN MX, JIANG H, HE L
2D MATERIALS
LI YY, CHEN MX, WEINERT M, LI L
2D MATERIALS
GONZALEZHERRERO H, CORTESDEL RIO E, MALLET P, VEUILLEN JY, PALACIOS JJ, GOMEZRODRIGUEZ JM, BRIHUEGA I, YNDURAIN F
2D MATERIALS
PAN Y, FOLSCH S, LIN YC, JARIWALA B, ROBINSON JA, NIE YF, CHO K, FEENSTRA RM