国家/地区
关键词 CROSSTALK（2）
出版物 MICROELECTRONICS RELIABILITY（2）
出版时间
机构
作者

Modeling and analysis of crosstalk induced overshoot/undershoot effects in multilayer graphene nanoribbon interconnects and its impact on gate oxide reliability

MICROELECTRONICS RELIABILITY

SAHOO M, RAHAMAN H

Crosstalk bandwidth and stability analysis in graphene nanoribbon interconnects

MICROELECTRONICS RELIABILITY

BAGHERI A, RANJBAR M, HAJINASIRI S, MIRZAKUCHAKI S