| 国家/地区 |
Taiwan（2）
|
| 关键词 | |
| 出版物 |
MICROELECTRONICS RELIABILITY（2）
|
| 出版时间 | |
| 机构 | |
| 作者 |
Infrared response of vanadium oxide (VOx)/SiNx/reduced graphene oxide (rGO) composite microbolometer
MICROELECTRONICS RELIABILITY
WU ZY, TANG SF, ZENG HY, LIN WJ, CHEN TC, GAU YT
MICROELECTRONICS RELIABILITY
NARULA U, TAN CM, LAI CS