国家/地区
关键词
出版物 MICROELECTRONICS RELIABILITY（2）
出版时间 2016（2）
机构
作者

Modeling and analysis of crosstalk induced overshoot/undershoot effects in multilayer graphene nanoribbon interconnects and its impact on gate oxide reliability

MICROELECTRONICS RELIABILITY

SAHOO M, RAHAMAN H

Copper induced synthesis of graphene using amorphous carbon

MICROELECTRONICS RELIABILITY

NARULA U, TAN CM, LAI CS