国家/地区
关键词 GRAPHENE（2）
出版物 ULTRAMICROSCOPY（3）
出版时间 2013（3）
机构
作者

The influence of inelastic scattering on EFTEM images-exemplified at 20 kV for graphene and silicon

ULTRAMICROSCOPY

LEE Z, ROSE H, HAMBACH R, WACHSMUTH P, KAISER U

Low-energy electron reflectivity from graphene: First-principles computations and approximate models

ULTRAMICROSCOPY

FEENSTRA RM, WIDOM M

Laboratory-based real and reciprocal space imaging of the electronic structure of few layer graphene on SiC(000(1)over-bar) using photoelectron emission microscopy

ULTRAMICROSCOPY

BARRETT N, WINKLER K, KROMKER B, CONRAD EH