▎ 摘　　要

Thermal conductance at the interface between metal and non-metal materials in the presence or absence of an inserted graphene layer is measured using a time domain transient thermoreflectance technique. The insertion of a single layer graphene between thermal evaporation Al film and Si substrate enhances the interfacial thermal conductance, because the graphene works as a mask to prevent the metal atoms diffusing into the substrate and causes the reduction of the intermixing layer thickness. Conversely, for the Al/Si interface with the Al film prepared by magnetron sputtering, the insertion of a single layer graphene increases the number of interface and leads to the decrease of the interfacial thermal conductance. (C) 2013 Elsevier Ltd. All rights reserved.