• 文献标题:   In-situ observation and atomic resolution imaging of the ion irradiation induced amorphisation of graphene
  • 文献类型:   Article
  • 作  者:   PAN CT, HINKS JA, RAMASSE QM, GREAVES G, BANGERT U, DONNELLY SE, HAIGH SJ
  • 作者关键词:  
  • 出版物名称:   SCIENTIFIC REPORTS
  • ISSN:   2045-2322
  • 通讯作者地址:   Univ Manchester
  • 被引频次:   33
  • DOI:   10.1038/srep06334
  • 出版年:   2014

▎ 摘  要

Ion irradiation has been observed to induce a macroscopic flattening and in-plane shrinkage of graphene sheets without a complete loss of crystallinity. Electron diffraction studies performed during simultaneous in-situ ion irradiation have allowed identification of the fluence at which the graphene sheet loses long-range order. This approach has facilitated complementary ex-situ investigations, allowing the first atomic resolution scanning transmission electron microscopy images of ion-irradiation induced graphene defect structures together with quantitative analysis of defect densities using Raman spectroscopy.