• 文献标题:   Strain-induced pseudo-magnetic fields and charging effects on CVD-grown graphene
  • 文献类型:   Article
  • 作  者:   YEH NC, TEAGUE ML, YEOM S, STANDLEY BL, WU RTP, BOYD DA, BOCKRATH MW
  • 作者关键词:   scanning tunneling microscopy, scanning tunneling spectroscopie, chemical vapor deposition, quantum effect, surface structure, morphology, topography, carbon
  • 出版物名称:   SURFACE SCIENCE
  • ISSN:   0039-6028
  • 通讯作者地址:   CALTECH
  • 被引频次:   36
  • DOI:   10.1016/j.susc.2011.03.025
  • 出版年:   2011

▎ 摘  要

Atomically resolved imaging and spectroscopic characteristics of graphene grown by chemical vapor deposition (CVD) on copper are investigated by means of scanning tunneling microscopy and spectroscopy (STM/STS). For CVD-grown graphene remaining on the copper substrate, the monolayer carbon structures exhibit ripples and appear strongly strained, with different regions exhibiting different lattice structures and electronic density of states (DOS). In particular, ridges appear along the boundaries of different lattice structures, which exhibit excess charging effects. Additionally, the large and non-uniform strain induces pseudo-magnetic field up to similar to 50 T, as manifested by the DOS peaks at quantized energies that correspond to pseudo-magnetic field-induced integer and fractional Landau levels. In contrast, for graphene transferred from copper to SiO2 substrates after the CVD growth, the average strain on the whole diminishes, so do the corresponding charging effects and pseudo-magnetic fields except for sample areas near topological defects. These findings suggest feasible nano-scale "strain engineering" of the electronic states of graphene by proper design of the substrates and growth conditions. (C) 2011 Elsevier B.V. All rights reserved.