• 文献标题:   Microstructures of GaN Thin Films Grown on Graphene Layers
  • 文献类型:   Article
  • 作  者:   YOO H, CHUNG K, CHOI YS, KANG CS, OH KH, KIM M, YI GC
  • 作者关键词:   gan film, graphene, transmission electron microscopy, threading dislocation, grain boundarie
  • 出版物名称:   ADVANCED MATERIALS
  • ISSN:   0935-9648
  • 通讯作者地址:   Seoul Natl Univ
  • 被引频次:   42
  • DOI:   10.1002/adma.201103829
  • 出版年:   2012

▎ 摘  要

Plan-view and cross-sectional transmission electron microscopy images show the microstructural properties of GaN thin films grown on graphene layers, including dislocation types and density, crystalline orientation and grain boundaries. The roles of ZnO nanowalls and GaN intermediate layers in the heteroepitaxial growth of GaN on graphene, revealed by cross-sectional transmission electron microscopy, are also discussed.