• 文献标题:   Influence of the silicon carbide surface morphology on the epitaxial graphene formation
  • 文献类型:   Article
  • 作  者:   OLIVEIRA MH, SCHUMANN T, RAMSTEINER M, LOPES JMJ, RIECHERT H
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951
  • 通讯作者地址:   Paul Drude Inst Festkorperelekt
  • 被引频次:   36
  • DOI:   10.1063/1.3638058
  • 出版年:   2011

▎ 摘  要

Graphene grown on SiC(0001) by Si depletion has a stepped surface with terraces and step heights up to 10 times larger than those observed in the original SiC surface. This is due to an additional step bunching that usually occurs during graphene formation. In this work, we show that such process can be suppressed by controlling the initial step structure of the SiC surface. In this case, the graphene monolayer is formed on the SiC without modification of the original surface morphology. We observe that the absence of step bunching during growth has no influence on the graphene structural quality. (C) 2011 American Institute of Physics. [doi:10.1063/1.3638058]