• 文献标题:   Field Effect Transistors Based on In Situ Fabricated Graphene Scaffold-ZrO2 Nanofilms
  • 文献类型:   Article
  • 作  者:   PANG QQ, CHEN HL, WANG XY, WANG T, WANG DY, FENG SG, LU HL, LI QW
  • 作者关键词:   field effect transistor, graphene scaffold, highk dielectric, metalorganic oligomer, ptype characteristic
  • 出版物名称:   ADVANCED ELECTRONIC MATERIALS
  • ISSN:   2199-160X
  • 通讯作者地址:   Fudan Univ
  • 被引频次:   1
  • DOI:   10.1002/aelm.201700424
  • 出版年:   2018

▎ 摘  要

Ionic liquid-gated electric double layer transistors (EDLTs), bottom-gated field effect transistors (FETs), and vertical Schottky barrier transistors are fabricated by utilizing in situ prepared heterostrutural nanofilms. The nanofilms feature graphene scaffolds on top of high-k ZrO2 dielectric, which allow transfer-free fabrication of various transistor devices. Both the ionic liquid-gated EDLT and bottom-gated FET feature p-type characteristic behaviors with notable I-on/I-off ratio and effective carrier modulation ability. Furthermore, the applicability of the layered structure is demonstrated in construction of vertical Schottky barrier transistors, and evident rectification behavior is revealed. With the capability to construct multilayer heterostructural nanofilms on various substrates and further optimizing the interfaces between these layers for targeted modulation, the presented electronic materials show potential application in graphene-based transistor fabrication.