• 文献标题:   Electrical Characteristics of Horizontally and Vertically Oriented Few-Layer Graphene on Si-Based Dielectrics
  • 文献类型:   Article
  • 作  者:   BEHURA SK, YANG QQ, HIROSE A, NAYAK S, JANI O, MUKHOPADHYAY I
  • 作者关键词:   nanostructure, vapor deposition, atomic force microscopy, raman spectroscopy, defect, heterojunction
  • 出版物名称:   JOURNAL OF NANOSCIENCE NANOTECHNOLOGY
  • ISSN:   1533-4880 EI 1533-4899
  • 通讯作者地址:   Gujarat Energy Res Management Inst
  • 被引频次:   2
  • DOI:   10.1166/jnn.2016.11028
  • 出版年:   2016

▎ 摘  要

Horizontally and vertically oriented few-layer graphenes have been synthesized directly on SiO2 coated Si substrates via thermal and hot-filament chemical vapor deposition, respectively. The effect of the direction of mass flow on the fabrication of graphene film is analysed and a plausible mechanism is proposed. The graphene/p-Si heterojunction is fabricated and tested for its potential in optoelectronic devices. Rectification behaviour is observed at the interface of graphene/p-Si under dark conditions. A dark current of 1.1 mA with an ideality factor of 1.5, in addition of a high rectification ratio of 15.99 at +/- 0.5 V is found for the vertically oriented graphene/p-Si heterojunction.