• 文献标题:   Intercalation of graphene on SiC(0001) via ion implantation
  • 文献类型:   Article
  • 作  者:   STOHR A, FORTI S, LINK S, ZAKHAROV AA, KERN K, STARKE U, BENIA HM
  • 作者关键词:  
  • 出版物名称:   PHYSICAL REVIEW B
  • ISSN:   2469-9950 EI 2469-9969
  • 通讯作者地址:   Max Planck Inst Festkorperforsch
  • 被引频次:   8
  • DOI:   10.1103/PhysRevB.94.085431
  • 出版年:   2016

▎ 摘  要

Electronic devices based on graphene technology are catching on rapidly and the ability to engineer graphene properties at the nanoscale is becoming, more than ever, indispensable. Here, we present a procedure of graphene functionalization on SiC(0001) that paves the way towards the fabrication of complex graphene electronic chips. The procedure resides on the well-known ion-implantation technique. The efficiency of the working principle is demonstrated by the intercalation of the epitaxial graphene layer on SiC(0001) with Bi atoms, which was not possible following standard procedures. The investigation of the obtained graphene system reveals no clear spin-orbit coupling enhancement expected by theory in addition to the presence of residual structural defects. Our graphene/SiC(0001) intercalation procedure puts forward the ion-beam lithography to nanostructure and functionalize desired graphene chips.