▎ 摘　　要

We investigate hot Carrier propagation across graphene using an electrical nonlocal injection/detection method. The device consists of a monolayer graphene flake, contacted by multiple metal leads. Using two remote leads for electrical heating, we generate a carrier temperature gradient that results in a measurable thermoelectric voltage V-NL across the remaining (detector) leads. Due to the nonlocal character, of the measurement, VNL is exclusively due to the Seebeck effect. Remarkably, a departure from The Ordinary relationship between Joule power P and V-NL, V-NL similar to P, becomes readily apparent at low temperatures, representing a finger,print of hot-carrier dominated thermoelectricity. By studying V-NL as a function of bias, we directly determine the carrier temperature and the characteristic cooling length for hot-carrier propagation, which are key parameters, for a variety of new applications that rely on hot-carrier transport.