• 文献标题:   Controlling the Balance between Remote, Pinhole, and van der Waals Epitaxy of Heusler Films on Graphene/Sapphire
  • 文献类型:   Article
  • 作  者:   DU DX, JUNG T, MANZO S, LADUCA Z, ZHENG XQ, SU K, SARASWAT V, MCCHESNEY J, ARNOLD MS, KAWASAKI JK
  • 作者关键词:   graphene, epitaxy, membrane, heusler, strain
  • 出版物名称:   NANO LETTERS
  • ISSN:   1530-6984 EI 1530-6992
  • 通讯作者地址:  
  • 被引频次:   1
  • DOI:   10.1021/acs.nanolett.2c03187 EA OCT 2022
  • 出版年:   2022

▎ 摘  要

Remote epitaxy is promising for the synthesis of lattice-mismatched materials, exfoliation of membranes, and reuse of expensive substrates. However, clear experimental evidence of a remote mechanism remains elusive. Alternative mechanisms such as pinhole-seeded epitaxy or van der Waals epitaxy can often explain the resulting films. Here, we show that growth of the Heusler compound GdPtSb on clean graphene/sapphire produces a 30 degrees rotated (R30) superstructure that cannot be explained by pinhole epitaxy. With decreasing temperature, the fraction of this R30 domain increases, compared to the direct epitaxial R0 domain, which can be explained by a competition between remote versus pinhole epitaxy. Careful graphene/substrate annealing and consideration of the relative lattice mismatches are required to obtain epitaxy to the underlying substrate across a series of other Heusler films, including LaPtSb and GdAuGe. The R30 superstructure provides a possible experimental fingerprint of remote since it is inconsistent with the alternative mechanisms.