• 文献标题:   Atomic Structure of Reduced Graphene Oxide
  • 文献类型:   Article
  • 作  者:   GOMEZNAVARRO C, MEYER JC, SUNDARAM RS, CHUVILIN A, KURASCH S, BURGHARD M, KERN K, KAISER U
  • 作者关键词:   graphene oxide, transmission electron microscopy, defect
  • 出版物名称:   NANO LETTERS
  • ISSN:   1530-6984
  • 通讯作者地址:   Max Planck Inst Festkorperforsch
  • 被引频次:   714
  • DOI:   10.1021/nl9031617
  • 出版年:   2010

▎ 摘  要

Using high resolution transmission electron microscopy. we identify the specific atomic scale features in chemically derived graphene monolayers that originate from the oxidation-reduction treatment of graphene. The layers are found to comprise defect-free graphene areas with sizes of a few nanometers interspersed with defect areas dominated by clustered pentagons and heptagons. Interestingly, all carbon atoms in these defective areas are bonded to three neighbors maintaining a planar sp(2)-configuration, which makes them undetectable by spectroscopic techniques. Furthermore, we observe that they introduce significant in-plane distortions and strain in the surrounding lattice.