• 文献标题:   Raman Spectroscopy and Kelvin Probe Force Microscopy characteristics of the CVD suspended graphene
  • 文献类型:   Article
  • 作  者:   GAJEWSKI K, GONISZEWSKI S, SZUMSKA A, MOCZALA M, KUNICKI P, GALLOP J, KLEIN N, HAO L, GOTSZALK T
  • 作者关键词:   graphene, suspended graphene, kpfm, raman spectroscopy
  • 出版物名称:   DIAMOND RELATED MATERIALS
  • ISSN:   0925-9635 EI 1879-0062
  • 通讯作者地址:   Wroclaw Univ Technol
  • 被引频次:   13
  • DOI:   10.1016/j.diamond.2016.01.008
  • 出版年:   2016

▎ 摘  要

In this work we present combined Kelvin probe force microscopy and Raman spectroscopy studies of supported and suspended structures formed out of chemical vapor deposition (CVD) grown graphene. Work function of both suspended and supported graphene was -4.81 +/- 0.06eV and -4.92 +/- 0.06eV respectively. By G and 2D modes correlation we showed, that CVD graphene was influenced by biaxial strain. Increased contact potential difference (CPD) on the suspended graphene in comparison with the areas of the supported graphene was the sign of increased strain (from 0.05% to similar to 0.12%) rather than decreased doping (p-doping decreased from similar to 5.5 x 10(12)cm(-2) to similar to 4.5 x 10(12)cm(-2)). (C) 2016 Elsevier B.V. All rights reserved.