▎ 摘　　要

This paper presents computer simulations and quantum mechanical calculations of the electronic energetic and structural characteristics of stable bridge-like radiation defects in few-layer graphene and some experimental results of study such irradiated by scanning electron microscope (30 and 15 key) electron beams. Results of examination of few-layer graphene specimens in the pre-irradiated and post-irradiated states by optical, electron microscopy, X-ray energy dispersive spectroscopy and Raman spectroscopy are given. A possible physical mechanism of under threshold energy structural defects production is proposed. (C) 2013 Elsevier B.V. All rights reserved.