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  • 文献标题:   Second comment on: "The effect of pressure on morphological features and quality of synthesized graphene" [Res Chem Intermed DOI 10.1007/s11164-016-2594-8]
  • 文献类型:   Review
  • 作　　者:   GHADERI A, SOLAYMANI S, DALOUJI V
  • 作者关键词:   mountainsmap software, depth histogram, abbottfirestone curve, atomic force microscopy, scanning electron microscopy
  • 出版物名称:   RESEARCH ON CHEMICAL INTERMEDIATES
  • ISSN:   0922-6168 EI 1568-5675
  • 通讯作者地址:   Islamic Azad Univ
  • 被引频次:   0
  • DOI:   10.1007/s11164-017-2958-8
  • 出版年:   2017

▎ 摘　　要

Alipour et al. studied the effect of pressure on the morphological characteristics and quality of synthesized graphene based on scanning electron microscopy (SEM) data [R. Alipour, M. R. Riazifar, T. Afsari, Res Chem Intermed DOI 10.1007/s11164-016-2594-8] and answered [R. Alipour, Res Chem Intermed DOI 10.1007/s11164-016-2800-8] a comment explaining the basics of the depth histogram and fractal calculations [Res Chem Intermed DOI 10.1007/s11164-016-2758-6]. Herein, we strictly emphasize the mistakes in using SEM images for micromorphological characterization.