• 文献标题:   Graphene in ohmic contact for both n-GaN and p-GaN
  • 文献类型:   Article
  • 作  者:   ZHONG HJ, LIU ZH, SHI L, XU GZ, FAN YM, HUANG ZL, WANG JF, REN GQ, XU K
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Chinese Acad Sci
  • 被引频次:   11
  • DOI:   10.1063/1.4880732
  • 出版年:   2014

▎ 摘  要

The wrinkles of single layer graphene contacted with either n-GaN or p-GaN were found both forming ohmic contacts investigated by conductive atomic force microscopy. The local I-V results show that some of the graphene wrinkles act as high-conductive channels and exhibiting ohmic behaviors compared with the flat regions with Schottky characteristics. We have studied the effects of the graphene wrinkles using density-functional-theory calculations. It is found that the standing and folded wrinkles with zigzag or armchair directions have a tendency to decrease or increase the local work function, respectively, pushing the local Fermi level towards n- or p-type GaN and thus improving the transport properties. These results can benefit recent topical researches and applications for graphene as electrode material integrated in various semiconductor devices. (C) 2014 AIP Publishing LLC.