• 文献标题:   Isothermal Growth and Stacking Evolution in Highly Uniform Bernal-Stacked Bilayer Graphene
  • 文献类型:   Article
  • 作  者:   SOLISFERNANDEZ P, TERAO Y, KAWAHARA K, NISHIYAMA W, UWANNO T, LIN YC, YAMAMOTO K, NAKASHIMA H, NAGASHIO K, HIBINO H, SUENAGA K, AGO H
  • 作者关键词:   bilayer graphene, cvd, ab stacking, band gap, fieldeffect transistor
  • 出版物名称:   ACS NANO
  • ISSN:   1936-0851 EI 1936-086X
  • 通讯作者地址:   Kyushu Univ
  • 被引频次:   1
  • DOI:   10.1021/acsnano.0c00645
  • 出版年:   2020

▎ 摘  要

Controlling the stacking order in bilayer graphene (BLG) allows realizing interesting physical properties. In particular, the possibility of tuning the band gap in Bernal-stacked (AB) BLG (AB-BLG) has a great technological importance for electronic and optoelectronic applications. Most of the current methods to produce AB-BLG suffer from inhomogeneous layer thickness and/or coexistence with twisted BLG. Here, we demonstrate a method to synthesize highly pure large-area ABBLG by chemical vapor deposition using Cu-Ni films. Increasing the reaction time resulted in a gradual increase of the AB stacking, with the BLG eventually free from twist regions for the longer growth times (99.4% of BLG has AB stacking), due to catalystassisted continuous BLG reconstruction driven by carbon dissolution-segregation processes. The band gap opening was confirmed by the electrical measurements on field-effect transistors using two different device configurations. The concept of the continuous reconstruction to achieve highly pure AB-BLG offers a way to control the stacking order of catalytically grown two-dimensional materials.