• 文献标题:   Wrinkle-Free Single-Crystal Graphene Wafer Grown on Strain-Engineered Substrates
  • 文献类型:   Article
  • 作  者:   DENG B, PANG ZQ, CHEN SL, LI X, MENG CX, LI JY, LIU MX, WU JX, QI Y, DANG WH, YANG H, ZHANG YF, ZHANG J, KANG N, XU HQ, FU Q, QIU XH, GAO P, WEI YJ, LIU ZF, PENG HL
  • 作者关键词:   graphene wrinkle, ultraflat, strain engineering, single crystal, thermal mismatch
  • 出版物名称:   ACS NANO
  • ISSN:   1936-0851 EI 1936-086X
  • 通讯作者地址:   Peking Univ
  • 被引频次:   30
  • DOI:   10.1021/acsnano.7b06196
  • 出版年:   2017

▎ 摘  要

Wrinkles are ubiquitous for graphene films grown on various substrates by chemical vapor deposition at high temperature due to the strain induced by thermal mismatch between the graphene and substrates, which greatly degrades the extraordinary properties of graphene. Here we show that the wrinkle formation of graphene grown on Cu substrates is strongly dependent on the crystallographic orientations. Wrinkle-free single-crystal graphene was grown on a wafer-scale twin-boundary-free single-crystal Cu(111) thin film fabricated on sapphire substrate through strain engineering. The wrinkle-free feature of graphene originated from the relatively small thermal expansion of the Cu(111) thin film substrate and the relatively strong interfacial coupling between Cu(111) and graphene, based on the strain analyses as well as molecular dynamics simulations. Moreover, we demonstrated the transfer of an ultraflat graphene film onto target substrates from the reusable single-crystal Cu(111)/sapphire growth substrate. The wrinkle-free graphene shows enhanced electrical mobility compared to graphene with wrinkles.