▎ 摘　　要

Graphene nanoribbons (GNRs) fabricated using electron beam lithography are investigated using tip-enhanced Raman spectroscopy (TERS) with a spatial resolution of 5 nm under ambient conditions. High-resolution TERS imaging reveals a structurally modified 5-10 nm strip of disordered graphene at the edge of the GNRs. Furthermore, hyperspectral TERS imaging discovers the presence of nanoscale organic contaminants on the GNRs. These results pave the way for nanoscale chemical and structural characterisation of graphene-based devices using TERS.