• 文献标题:   Field emission characteristics of pristine and N-doped graphene measured by in-situ transmission electron microscopy
  • 文献类型:   Article
  • 作  者:   KASHID RV, YUSOP MZ, TAKAHASHI C, KALITA G, PANCHAKARLA LS, JOAG DS, MORE MA, TANEMURA M
  • 作者关键词:  
  • 出版物名称:   JOURNAL OF APPLIED PHYSICS
  • ISSN:   0021-8979
  • 通讯作者地址:   Nagoya Inst Technol
  • 被引频次:   15
  • DOI:   10.1063/1.4809930
  • 出版年:   2013

▎ 摘  要

We report the field emission characteristics of a few-layer pristine and N-doped graphene by the in-situ transmission electron microscopy. The measurements were performed with a Pt-Ir nanoprobe and at a vacuum gap of 400 nm. The turn on voltage, required to draw an emission current of 1 nA from pristine and N-doped graphene, was found to be 230 and 110 V, respectively. The lower turn on voltage for the N-doped graphene can be explained from the improved electrical conductivity and up-shift of the Fermi level with nitrogen doping. Structural deformation/contraction/buckling of the N-doped graphene sheet was observed with the field emission current exceeding similar to 6.9 mu A, which can be attributed to the Joule heating. (C) 2013 AIP Publishing LLC.