• 文献标题:   Visualizing Electrical Breakdown and ON/OFF States in Electrically Switchable Suspended Graphene Break Junctions
  • 文献类型:   Article
  • 作  者:   ZHANG H, BAO WZ, ZHAO Z, HUANG JW, STANDLEY B, LIU G, WANG FL, KRATZ P, JING L, BOCKRATH M, LAU CN
  • 作者关键词:   suspended graphene, switche, electromigration, nonvolatile memory, break junction
  • 出版物名称:   NANO LETTERS
  • ISSN:   1530-6984
  • 通讯作者地址:   Univ Calif Riverside
  • 被引频次:   27
  • DOI:   10.1021/nl203160x
  • 出版年:   2012

▎ 摘  要

Narrow gaps are formed in suspended single- to few-layer graphene devices using a pulsed electrical breakdown technique. The conductance of the resulting devices can be programmed by the application of voltage pulses, with voltages of 2.5 to similar to 4.5 V, corresponding to an ON pulse, and similar to 8 V, corresponding to an OFF pulse. Electron microscope imaging of the devices shows that the graphene sheets typically remain suspended and that the device conductance tends to zero when the observed gap is large. The switching rate is strongly temperature dependent, which rules out a purely electromechanical switching mechanism. This observed switching in suspended graphene devices strongly suggests a switching mechanism via atomic movement and/or chemical rearrangement and underscores the potential of all-carbon devices for integration with graphene electronics.