• 文献标题:   On the Differing Sensitivity to Chemical Gating of Single and Double Layer Epitaxial Graphene Explored Using Scanning Kelvin Probe Microscopy
  • 文献类型:   Article
  • 作  者:   PEARCE R, ERIKSSON J, IAKIMOV T, HULTMAN L, SPETZ AL, YAKIMOVA R
  • 作者关键词:   epitaxial graphene, environmental gating, scanning kelvin probe microscopy skpm, gas sensor, thicknes, dependence
  • 出版物名称:   ACS NANO
  • ISSN:   1936-0851 EI 1936-086X
  • 通讯作者地址:   Natl Phys Lab
  • 被引频次:   21
  • DOI:   10.1021/nn3052633
  • 出版年:   2013

▎ 摘  要

Using environmental scanning Kelvin probe microscopy, we show that the position of the Fermi level of single layer graphene is more sensitive to chemical gating than that of double layer graphene. We calculate that the difference in sensitivity to chemical gating is not entirely due to the difference in band structure of 1 and 2 layer graphene. The findings are important 0 for gas sensing where the sensitivity of the electronic properties to gas adsorption is monitored and suggest that single layer graphene could make a more sensitive gas sensor than double layer graphene. We propose that the difference in surface potential between 10 adsorbate-free single and double layer graphene, measured using scanning kelvin probe microscopy, can be used as a noninvasive method of estimating substrate-induced doping in epitaxial graphene.