• 文献标题:   Measurement Back-Action in Stacked Graphene Quantum Dots
  • 文献类型:   Article
  • 作  者:   BISCHOFF D, EICH M, ZILBERBERG O, ROSSLER C, IHN T, ENSSLIN K
  • 作者关键词:   graphene nanoribbon, van der waals heterostructure, measurement backaction, charge detection, capacitively coupled double dot
  • 出版物名称:   NANO LETTERS
  • ISSN:   1530-6984 EI 1530-6992
  • 通讯作者地址:   ETH
  • 被引频次:   26
  • DOI:   10.1021/acs.nanolett.5b02167
  • 出版年:   2015

▎ 摘  要

We present an electronic transport experiment in graphene where both classical and quantum mechanical charge detector back-action on a quantum dot are investigated. The device consists of two stacked graphene quantum dots separated by a thin layer of boron nitride. This device is fabricated by van der Waals stacking and is equipped with separate source and drain contacts to both dots. By applying a finite bias to one quantum dot, a current is induced in the other unbiased dot. We present an explanation of the observed measurement-induced current based on strong capacitive coupling and energy dependent tunneling barriers, breaking the spatial symmetry in the unbiased system. This is a special feature of graphene-based quantum devices. The experimental observation of transport in classically forbidden regimes is understood by considering higher-order quantum mechanical back-action mechanisms.