• 文献标题:   Carbon rehybridization at the graphene/SiC(0001) interface: Effect on stability and atomic-scale corrugation
  • 文献类型:   Article
  • 作  者:   SCLAUZERO G, PASQUARELLO A
  • 作者关键词:  
  • 出版物名称:   PHYSICAL REVIEW B
  • ISSN:   2469-9950 EI 2469-9969
  • 通讯作者地址:   Ecole Polytech Fed Lausanne
  • 被引频次:   22
  • DOI:   10.1103/PhysRevB.85.161405
  • 出版年:   2012

▎ 摘  要

We address the energetic stability of the graphene/SiC(0001) interface and the associated binding mechanism by studying a series of low-strain commensurate interface structures within a density functional scheme. Among the structures with negligible strain, the 6 root 3x6 root 3R30 degrees SiC periodicity shows the lowest interface energy, providing a rationale for its frequent experimental observation. The interface stability is driven by the enhanced local reactivity of the substrate-bonded graphene atoms undergoing sp(2)-to-sp(3) rehybridization (pyramidalization). By this mechanism, relaxed structures of higher stability exhibit more pronounced graphene corrugations at the atomic scale.