• 文献标题:   Nondestructive and in situ determination of graphene layers using optical fiber Fabry-Perot interference
  • 文献类型:   Article
  • 作  者:   LI C, PENG XB, LIU QW, GAN X, LV RT, FAN SC
  • 作者关键词:   graphene diaphragm, thickness measurement, optical reflectivity, fabryperot interference
  • 出版物名称:   MEASUREMENT SCIENCE TECHNOLOGY
  • ISSN:   0957-0233 EI 1361-6501
  • 通讯作者地址:   Beihang Univ
  • 被引频次:   4
  • DOI:   10.1088/1361-6501/aa54f8
  • 出版年:   2017

▎ 摘  要

Thickness measurement plays an important role for characterizing optomechanical behaviors of graphene. From the view of graphene-based Fabry-Perot (F-P) sensors, a simple, nondestructive and in situ method of determining the thickness of nanothick graphene membranes was demonstrated by using optical fiber F-P interference. Few-layer/ multilayer graphene sheets were suspendedly adhered onto the endface of a ferrule with a 125 ae m inner diameter by van der Waals interactions to construct micro F-P cavities. Along with the Fresnel's law and complex index of refraction of the membrane working as a light reflector of an F-P interferometer, the optical reflectivity of graphene was modeled to investigate the effects of light wavelength and temperature. Then the average thickness of graphene membranes were extracted by F-P interference demodulation, and yielded a very strong cross-correlation coefficient of 99.95% with the experimental results observed by Raman spectrum and atomic force microscope. The method could be further extended for determining the number of layers of other 2D materials.