• 文献标题:   Large-Area and High-Quality Epitaxial Graphene on Off-Axis SiC Wafers
  • 文献类型:   Article
  • 作  者:   OUERGHI A, SILLY MG, MARANGOLO M, MATHIEU C, EDDRIEF M, PICHER M, SIROTTI F, EL MOUSSAOUI S, BELKHOU R
  • 作者关键词:   epitaxial graphene, spectroscopy, vicinal sic, scanning tunneling microscopy, lowenergy electron microscopy, electronic propertie
  • 出版物名称:   ACS NANO
  • ISSN:   1936-0851
  • 通讯作者地址:   CNRS
  • 被引频次:   50
  • DOI:   10.1021/nn301152p
  • 出版年:   2012

▎ 摘  要

The growth of large and uniform graphene layers remains very challenging to this day due to the close correlation between the electronic and transport properties and the layer morphology. Here, we report the synthesis of uniform large-scale mono- and bilayers of graphene on off-axis 6H-SiC(0001) substrates. The originality of our approach consists of the fine control of the growth mode of the graphene by precise control of the Si sublimation rate. Moreover, we take advantage of the presence of nanofacets on the off-axis substrate to grow a large and uniform graphene with good long-range order. We believe that our approach represents a significant step toward the scalable synthesis of graphene films with high structural qualities and fine thickness control, in order to develop graphene-based electronic devices.