• 文献标题:   Nanoanalysis of graphene layers using scanning probe techniques
  • 文献类型:   Review
  • 作  者:   CONNOLLY MR, SMITH CG
  • 作者关键词:   scanning probe microscopy, graphene, mesoscopic device
  • 出版物名称:   PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY AMATHEMATICAL PHYSICAL ENGINEERING SCIENCES
  • ISSN:   1364-503X EI 1471-2962
  • 通讯作者地址:   Univ Cambridge
  • 被引频次:   17
  • DOI:   10.1098/rsta.2010.0222
  • 出版年:   2010

▎ 摘  要

Graphene is an almost ideal two-dimensional system. Unlike other two-dimensional electron gas systems realized in silicon or gallium arsenide, the electron wave functions are very close to the surrounding environment. While this causes problems in trying to passivate the surface without reducing the mobility, it does allow direct electrical access to the two-dimensional surface states using scanning probe techniques. In this review, we look at recent advances in the nanoanalytics of the surface and edges of graphene using scanning probe techniques.