▎ 摘　　要

In this work, a novel method for the quantitative determination of defects on graphene surfaces has been presented in order to provide accurate, reliable and quantitative information for the defects on graphene products. It was based on the selective adsorption of a specific polar organic ion (Sodium benzenesulfonate) on the edges and defects on graphene surfaces, and the atomic force microscopy (AFM) imaging of the adsorption. By means of an image processing software, the AFM images could be analyzed and the areas as well as area percentages of the defects on the graphene surfaces could be determined. (C) 2017 Elsevier Inc. All rights reserved.