▎ 摘　　要

Two-dimensional (2D) moire materials have attracted a lot of attention and opened a new research frontier of twistronics due to their novel physical properties. Although great progress has been achieved, the inability to precisely and reproducibly manipulate the twist angle hinders the further development of twistronics. Here, we demonstrated an atomic force microscope (AFM) tip manipulation method to control the interlayer twist angle of epitaxial MoS2/graphene heterostructure with an ultra-high accuracy better than 0.1 degrees. Furthermore, conductive AFM and spectroscopic characterizations were conducted to show the effects of the twist angle on moire pattern wavelength, phonons and excitons. Our work provides a technique to precisely control the twist angle of 2D moire materials, enabling the possibility to establish the phase diagrams of moire physics with twist angle.