• 文献标题:   Contact resistance improvement by the modulation of peripheral length to area ratio of graphene contact pattern
  • 文献类型:   Article
  • 作  者:   CHO C, LEE SK, NOH JW, PARK W, LEE S, LEE YG, HWANG HJ, KANG CG, HAM MH, LEE BH
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Gwangju Inst Sci Technol
  • 被引频次:   3
  • DOI:   10.1063/1.4921797
  • 出版年:   2015

▎ 摘  要

High contact resistance between graphene and metal is a major huddle for high performance electronic device applications of graphene. In this work, a method to improve the contact resistance of graphene is investigated by varying the ratio of peripheral length and area of graphene pattern under a metal contact. The contact resistance decreased to 0.8 kX Omega.mu m from 2.1 k Omega.mu m as the peripheral length increased from 312 to 792 lm. This improvement is attributed to the low resistivity of edge-contacted graphene, which is 8.1 x 10(5) times lower than that of top-contacted graphene. (C) 2015 AIP Publishing LLC.