• 文献标题:   Imaging the potential distribution of individual charged impurities on graphene by low-energy electron holography
  • 文献类型:   Article
  • 作  者:   LATYCHEVSKAIA T, WICKI F, ESCHER C, FINK HW
  • 作者关键词:   electron holography, inline holography, gabor holography, lowenergy electron, graphene, charged impuritie
  • 出版物名称:   ULTRAMICROSCOPY
  • ISSN:   0304-3991 EI 1879-2723
  • 通讯作者地址:   Univ Zurich
  • 被引频次:   4
  • DOI:   10.1016/j.ultramic.2017.07.019
  • 出版年:   2017

▎ 摘  要

While imaging individual atoms can routinely be achieved in high resolution transmission electron microscopy, visualizing the potential distribution of individually charged adsorbates leading to a phase shift of the probing electron wave is still a challenging task. Low-energy electrons (30-250 eV) are sensitive to localized potential gradients. We employed low-energy electron holography to acquire in-line holograms of individual charged impurities on free-standing graphene. By applying an iterative phase retrieval reconstruction routine we recover the potential distribution of the localized charged impurities present on free-standing graphene. (C) 2017 Elsevier B.V. All rights reserved.