• 文献标题:   Evidence of atomically resolved 6x6 buffer layer with long-range order and short-range disorder during formation of graphene on 6H-SiC by thermal decomposition
  • 文献类型:   Article
  • 作  者:   HU TW, MA F, MA DY, YANG D, LIU XT, XU KW, CHU PK
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951
  • 通讯作者地址:   Xi An Jiao Tong Univ
  • 被引频次:   12
  • DOI:   10.1063/1.4804290
  • 出版年:   2013

▎ 摘  要

Scanning tunneling microscopy (STM) is performed to study the formation mechanism of graphene on 6H-SiC by thermal decomposition in situ and the evolution of an atomically resolved 6 x 6 structure in the buffer layer is revealed. The long-range order of the 6 x 6 structure is maintained during growth, but the short-range arrangement changes with temperature. Based on STM images acquired at different voltages, a structure consisting of triangular silicon clusters with the 6 x 6 structure and filled by amorphous carbon atoms is proposed. The 6 x 6 silicon clusters serve as the template and amorphous carbon atoms provide the carbon source for graphene growth. (C) 2013 AIP Publishing LLC.