• 文献标题:   Using Si textured structure to build vertical graphene sharp edges for electron field emission
  • 文献类型:   Article
  • 作  者:   CHEN LF, YU H, ZHONG JS, WU J, SU WT
  • 作者关键词:   graphene, field emission, vertical sharp edge, textured structure, si substrate
  • 出版物名称:   MATERIALS RESEARCH EXPRESS
  • ISSN:   2053-1591
  • 通讯作者地址:   Hangzhou Dianzi Univ
  • 被引频次:   0
  • DOI:   10.1088/2053-1591/ab19ec
  • 出版年:   2019

▎ 摘  要

The Vertically-orientated graphene (GP) sharp edges can provide a high density of individual field emission sites and a high field emission enhancement factor. In this report, we used a Si textured structure to build the vertical GP field emission edges. Relying on the periodical textured arrays of the Si surface, a large number of vertical sharp edges of GP are formed on the Si substrate during the electrophoretic deposition process. The vertical GP edges on the textured structure of Si shows a low turn-on electric field of 0.43 V-1 mu m(-1), a high enhancement factor of 9450, excellent stability behavior and a uniform luminance intensity image. The excellent field emission properties for the vertical edges are explored and discussed in detail. This investigation of the vertical GP edges on a textured Si surface suggests a potential prospect in application in future field electron emission devices.